DB FIB/EDS

Dual Beam FIB 雙束聚焦離子束

Precision cut for the defectives for different kinds of material.
Sample preparation for TEM, SEM, SSRM and special request.
Mirco-probing system for advantage application.

–FIB analysis on Samsung S5KGW2 BSI image sensor

(HOT!!) Advanced Equipment (FEI / Helios Dual- Beam) 

–FIB(Dual Beam) Capability

Low energy benefits: lithographic resist
 

● stable at 500V

● Better Material and grain orientation contrast(SEI)

▍工程聯繫窗口

SEM 陳小姐 分機6211
E-mail: lynn_chen@msscorps.com