汎銓科技OBIRCH設備量充足,提供您迅速有效之分析服務!
Hamamatsu uAMOS-200
OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance failure in LSI devices.
分機6863 , 6399
E-mail: emmi@msscorps.com
分機3011 3012
E-mail: emmi_zb@msscorps.com